Electronic effect

Results: 698



#Item
571Compact model for ultra-short channel four-terminal DG MOSFETs for exploring circuit characteristics T. Nakagawa, T. Sekigawa, T. Tsutsumi*, M. Hioki, E. Suzuki, and H. Koike Electroinformatics Group, Nanoelectronics Res

Compact model for ultra-short channel four-terminal DG MOSFETs for exploring circuit characteristics T. Nakagawa, T. Sekigawa, T. Tsutsumi*, M. Hioki, E. Suzuki, and H. Koike Electroinformatics Group, Nanoelectronics Res

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Source URL: www.nsti.org

Language: English - Date: 2005-05-23 13:18:26
572Systems and Technology Group  Modeling of Gate Leakage, Floating Body Effect, and History Effect in 32nm HKMG PD-SOI CMOS Yanqing Deng, Rajvi Rupani, James Johnson, Scott Springer

Systems and Technology Group Modeling of Gate Leakage, Floating Body Effect, and History Effect in 32nm HKMG PD-SOI CMOS Yanqing Deng, Rajvi Rupani, James Johnson, Scott Springer

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Source URL: www.techconnectworld.com

Language: English - Date: 2010-08-24 11:11:21
573Compact modeling for Multiple-Gate SOI MOSFETs B. Iñiguez*, H. A. Hamid*, D. Jiménez** and J. Roig*** *

Compact modeling for Multiple-Gate SOI MOSFETs B. Iñiguez*, H. A. Hamid*, D. Jiménez** and J. Roig*** *

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:54:03
574Professor Chih-Tang Sah started a book series on compact modeling, five years ago when we first came to this Workshop on Compact Modeling. The following two slides show the flyers about this book series.

Professor Chih-Tang Sah started a book series on compact modeling, five years ago when we first came to this Workshop on Compact Modeling. The following two slides show the flyers about this book series.

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Source URL: www.techconnectworld.com

Language: English - Date: 2010-08-24 11:10:47
575ADVANCED COMPACT MOSFET (ACM) MODEL Self-Consistent DC, AC, Noise and Mismatch MOSFET Models for Circuit Design. Carlos Galup-Montoro

ADVANCED COMPACT MOSFET (ACM) MODEL Self-Consistent DC, AC, Noise and Mismatch MOSFET Models for Circuit Design. Carlos Galup-Montoro

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:35:59
5761  Swiss Center for Electronics and Microtechnology MOS Transistor Modeling for RF Integrated Circuit Design

1 Swiss Center for Electronics and Microtechnology MOS Transistor Modeling for RF Integrated Circuit Design

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:21:27
577CMOS RF Modeling and Parameter Extraction Approaches Taking Charge Conservation into Account April 24, 2002  Minkyu Je, Ickjin Kwon, Jeonghu Han,

CMOS RF Modeling and Parameter Extraction Approaches Taking Charge Conservation into Account April 24, 2002 Minkyu Je, Ickjin Kwon, Jeonghu Han,

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:18:49
578Environmental Testing and Radiation Sensor Technology Demonstration Payload The Environmental Testing and Radiation Sensor monitors the effect of radiation on electrical components in orbit.

Environmental Testing and Radiation Sensor Technology Demonstration Payload The Environmental Testing and Radiation Sensor monitors the effect of radiation on electrical components in orbit.

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Source URL: esamultimedia.esa.int

Language: English - Date: 2013-05-15 12:14:56
579Microsoft PowerPoint - wcm05_niknejad.ppt

Microsoft PowerPoint - wcm05_niknejad.ppt

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:53:53
580SEPTIC SYSTEM SCHEDULE OF VALUES April 2014 Costs are based on an average site with no significant limiting conditions that would effect construction. Additional funding will be considered if justified by specific site c

SEPTIC SYSTEM SCHEDULE OF VALUES April 2014 Costs are based on an average site with no significant limiting conditions that would effect construction. Additional funding will be considered if justified by specific site c

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Source URL: www.cwconline.org

Language: English - Date: 2014-05-20 14:12:58